Master'sRobotics, Automation & Control Applications open

Master’s in Vision, Metrology & Edge AI Engineering

Online master's programme of 1,900 hours in vision, metrology and edge AI engineering. 12 modules covering industrial machine vision, image processing, dimensional metrology, 3D vision, deep learning for inspection, edge AI hardware and model optimisation, plant integration, industrial MLOps and validation under EMVA 1288, GenICam and VDI/VDE 2634 Part 2, with an assigned technical tutor.

Duration1900 h
ModeOnline
LanguageEnglish
Start datesSet by the faculty
AwardSEIUM Institute diploma
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Learning outcomes

What you will be able to do

01

Design industrial vision systems with suitable optics and lighting.

02

Apply image processing techniques to inspection.

03

Carry out dimensional measurements with known uncertainty.

04

Develop deep learning models for defect detection.

05

Optimise and deploy models on edge hardware.

06

Integrate vision systems with PLCs and MES.

07

Validate inspection systems in regulated environments.

Profile

Who it's for

  • Machine vision engineers.
  • Optical metrology specialists.
  • Embedded AI engineers.
  • Inspection systems integrators.
  • Quality engineers.
  • Industrial MLOps engineers.
  • Engineering or science graduates aiming to enter the automotive sector.
Standards & tools

What you'll work with

  • EMVA 1288 (camera and image sensor characterisation)
  • GenICam (generic camera programming interface)
  • VDI/VDE 2634 Part 2 (optical 3D measuring systems)
  • JCGM 100:2008 – GUM (guide to the expression of uncertainty in measurement)
  • Regulation (EU) 2024/1689 (EU Artificial Intelligence Act)
  • ISO 10360-1:2000 (acceptance and verification of CMMs – vocabulary)
  • IEC 62443-4-2:2019 (security requirements for IACS components)
  • ISO 22514-7:2021 (capability of measurement processes)
  • MVTec Halcon
  • OpenCV
  • NVIDIA TensorRT
  • Intel OpenVINO
  • Open3D
Syllabus

12 modules · 1900 h

  1. 1.1Components of a vision system
  2. 1.2Industrial CMOS and CCD sensors
  3. 1.3Optics, focal length and depth of field
  4. 1.4Lighting techniques: bright field and dark field
  5. 1.5Backlighting and structured light
  6. 1.6EMVA 1288 camera standard
  7. 1.7GigE Vision and USB3 Vision interfaces
  8. 1.8Triggering, synchronisation and encoders
  9. 1.9Line-scan cameras for continuous materials
  10. 1.10Lab: optics selection for an inspection task
  1. 2.1Spatial filters and morphology
  2. 2.2Thresholding and classical segmentation
  3. 2.3Sub-pixel edge detection
  4. 2.4Blob analysis and geometric measurements
  5. 2.5Template matching and pattern search
  6. 2.6Hough transform
  7. 2.7Code reading and industrial OCR
  8. 2.8Distortion correction
  9. 2.9Programming with OpenCV and Halcon
  10. 2.10Practical: presence inspection with OpenCV
  1. 3.1Intrinsic and extrinsic calibration
  2. 3.2Telecentric lenses for measurement
  3. 3.3Measuring diameters and distances
  4. 3.4Uncertainty according to the GUM
  5. 3.5Measurement system analysis (MSA)
  6. 3.6Gage R&R studies
  7. 3.7Traceability to reference standards
  8. 3.8Temperature and measurement stability
  9. 3.9Comparison with coordinate measuring machines
  10. 3.10Case study: R&R study of an optical gauge
  1. 4.1Laser triangulation and profilometers
  2. 4.2Structured light and fringe projection
  3. 4.3Stereo and time-of-flight cameras
  4. 4.4Point clouds and filtering
  5. 4.5Point cloud registration and CAD alignment
  6. 4.6Flatness and volume inspection
  7. 4.7Formats and libraries: PCL and Open3D
  8. 4.8Accuracy to VDI/VDE 2634
  9. 4.93D vision-guided robots
  10. 4.10Lab: warpage measurement with a profilometer
  1. 5.1Convolutional networks for classification
  2. 5.2Object detection with YOLO
  3. 5.3Semantic segmentation of defects
  4. 5.4Anomaly detection without labelled defects
  5. 5.5Data augmentation and synthetic data
  6. 5.6Labelling and dataset management
  7. 5.7Metrics: precision, recall and ROC curves
  8. 5.8Explainability with activation maps
  9. 5.9Managing false rejects
  10. 5.10Practical: anomaly detector with PatchCore
  1. 6.1NVIDIA Jetson architectures
  2. 6.2Hailo and Coral TPU accelerators
  3. 6.3Intel processors with OpenVINO
  4. 6.4FPGAs and smart cameras
  5. 6.5Power consumption and heat dissipation
  6. 6.6In-line latency constraints
  7. 6.7Performance-per-watt comparison
  8. 6.8Industrial ruggedness and certifications
  9. 6.9Platform selection by application
  10. 6.10Case study: sizing edge hardware
  1. 7.1Quantisation to INT8 and FP16
  2. 7.2Pruning and knowledge distillation
  3. 7.3Export to ONNX
  4. 7.4Optimisation with TensorRT
  5. 7.5Inference with OpenVINO
  6. 7.6Latency and throughput benchmarking
  7. 7.7Pipelines with DeepStream
  8. 7.8Accuracy loss after optimisation
  9. 7.9Memory management on devices
  10. 7.10Lab: deploying YOLO on Jetson
  1. 8.1Communication with PLCs over Profinet
  2. 8.2Publishing results with OPC UA
  3. 8.3Part rejection and synchronisation
  4. 8.4Integration with MES and traceability
  5. 8.5Inspection HMI interfaces
  6. 8.6Image storage and audit
  7. 8.7Hybrid edge-cloud architectures
  8. 8.8Containerisation with Docker
  9. 8.9Security of vision devices
  10. 8.10Practical: integrating inspection with a PLC
  1. 9.1Life cycle of vision models
  2. 9.2Data and model versioning
  3. 9.3Data drift detection
  4. 9.4Continuous retraining with new data
  5. 9.5OTA deployment to device fleets
  6. 9.6Model quality monitoring
  7. 9.7Validation before releasing versions
  8. 9.8Governance and documentation
  9. 9.9EU Artificial Intelligence Act
  10. 9.10Workshop: retraining pipeline
  1. 10.1Inspection of metal surfaces
  2. 10.2Weld inspection and thermal inspection
  3. 10.3Electronics: automated optical inspection
  4. 10.4Food: sorting and foreign bodies
  5. 10.5Pharmaceuticals: packaging verification
  6. 10.6Automotive: assembly verification
  7. 10.7Logistics: reading and dimensioning
  8. 10.8Textiles and wood: defects in continuous processes
  9. 10.9Return on investment in vision
  10. 10.10Case study: AI-based surface inspection
  1. 11.1Validation plan for a vision system
  2. 11.2Tests with master samples
  3. 11.3Inspection process capability
  4. 11.4Validation according to GAMP 5
  5. 11.5System risk analysis
  6. 11.6Technical documentation and traceability
  7. 11.7Maintenance and recalibration
  8. 11.8Quality audits
  9. 11.9Data-driven continuous improvement
  10. 11.10Practical: inspection validation plan
  1. 12.1Definition of the inspection problem
  2. 12.2Optical and lighting design
  3. 12.3Data acquisition and labelling
  4. 12.4AI model development
  5. 12.5Optimisation and deployment at the edge
  6. 12.6Integration with the line
  7. 12.7Metrological and classification validation
  8. 12.8Conclusions and industrial proposal
  9. 12.9Master's Thesis report
  10. 12.10Master's Thesis: defence before a panel
Methodology, software & labs

How you'll learn

A 100% online programme on the SEIUM campus, with downloadable material, recorded classes and an assigned technical tutor. There are no fixed timetables: you progress at your own pace within each intake, so it fits alongside your job.

Each module combines theory, guided reading of the original standard and applied exercises. The working software is MVTec Halcon, OpenCV, NVIDIA TensorRT, Intel OpenVINO and Open3D, in free, academic or evaluation versions. Exercises are based on real procedures: AI-based defect inspection at the edge, repeatability studies of optical gauges, and model deployment on Jetson. Assessment is continuous by module, plus the final Master's Thesis.

Standards covered: EMVA 1288, GenICam, VDI/VDE 2634 Part 2, JCGM 100:2008 (GUM), Regulation (EU) 2024/1689, ISO 10360-1:2000, IEC 62443-4-2:2019, ISO 22514-7:2021.

Assigned technical tutor:every module ends with a deliverable that your tutor marks individually.
Standards-based learning:guided reading of EMVA 1288, GenICam and VDI/VDE 2634 Part 2 applied to real cases, not as a theoretical annex.
Industry software:MVTec Halcon, OpenCV, NVIDIA TensorRT, Intel OpenVINO and Open3D, in free, academic or evaluation versions.
Master's Thesis with defence:A complete edge AI inspection system, from optical and lighting design and data labelling to model development, edge deployment, line integration and validation, defended before a panel.
Flexible format:100% online, no fixed timetables, compatible with full-time work.
Capstone project

Build it end to end

Your final project follows the real engineering workflow, step by step, reviewed by your tutor.

Define the inspection problem
Specify the inspection task and design the optics and lighting.
Acquire and label data
Capture and label the image dataset for training.
Develop and optimise the model
Train the AI model and optimise it for edge deployment.
Integrate and validate
Integrate the system with the line and carry out metrological and classification validation.
Master's Thesis
Present the inspection system and industrial proposal in your Master's Thesis, defended before a panel.
Career opportunities

Where this takes you

Machine Vision EngineerOptical Metrology SpecialistEmbedded AI EngineerInspection Systems IntegratorQuality EngineerIndustrial MLOps Engineer
Admissions & scholarships

Requirements

  • University degree in engineering, science or architecture, or equivalent proven professional experience.
  • Internet connection and a computer capable of running the programme software.
  • English sufficient to read technical standards.

Ready to start?

Send your application today. Our admissions team replies within 72 hours with your study plan and funding options.

FAQ

Frequently asked questions

The programme totals 1,900 hours over 12–14 months. You set your own pace within each intake, and your tutor helps you plan the workload around your job.

You work with MVTec Halcon, OpenCV, NVIDIA TensorRT, Intel OpenVINO and Open3D, using free, academic or evaluation versions. Your tutor indicates the free alternative wherever one exists.

A SEIUM Institute diploma, awarded on passing the continuous assessment and the Master's Thesis. It is SEIUM's own qualification, not an official state degree; its recognition depends on the programme completed and the regulations of each country.

Yes. Modules passed in a course or postgraduate diploma in the same area are recognised in the higher programme. Ask about the recognition policy when you enrol.

A degree in engineering, science or architecture (or equivalent professional experience), a computer able to run the software and English sufficient to read technical standards.

Start dates are set by SEIUM's faculty for each intake. Our admissions team will confirm the next available date when you apply.

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